Hagopian Presents at Microscopy and Microanalysis Conference

Nicholas Hagopian and Jingrui Wei presenters at Microscopy and Microanalysis Conference

The MSREC Honored Scholar Travel Award enabled Nicholas Hagopian to attend the 2024 Microscopy and Microanalysis conference held in Cleveland, Ohio. Hagopian, a PhD student in the Voyles group, conducts research on characterizing materials and interfaces with scanning transmission electron microscopy at atomic resolution.

The conference is attended by scientists in a range of fields and across a range of microscopy disciplines, from visible light to electron microscopy and in fields including biology, materials science, and physics. The wide range of subjects provided a plethora of unique and interesting talks to attend.

At the conference, Hagopian presented a poster on a branch of his research related to characterization of 2D materials, titled “High Resolution Surface Modification of WS2 via Plasma Oxidation and Electron Beam Reduction” (https://doi.org/10.1093/mam/ozae044.602). The work was a collaboration between the Voyles and Rhodes groups, leveraging the unique monolayer-terminated oxidation properties of transition metal dichalcogenides and the high-precision reduction capabilities of an electron beam in a scanning transmission electron microscope to create surface-confined W-nanoparticles across a range of morphologies with feature sizes as small as ~1.7 nm and pitches as small as 3.2 nm. The poster received interest from conference members and spurred engaging scientific discussion.

In addition, Hagopian was a co-author on a paper written by Jingrui Wei, another member of the Voyles group. The paper highlighted a novel electron counting technique developed by Wei, which enhanced detector accuracy and improved dataset quality. The paper (https://doi.org/10.1093/micmic/ozad132) received a “2024 Best Paper in Instrumentation and Software” award issued by the publishing journal, Microscopy and Microanalysis.