Ron Kelley, FEI, part of Thermo Fisher Scientific
Ron has focused charged particle beams for nearly 20 years, starting in failure analysis labs to his current applications engineer position at Thermo Fisher Scientific. Availability of the high current Xe ion source has solved many traditional analytical challenges and opened up new application spaces. His main focus today is optimizing the plasma FIB for new applications, including large volume 3D data collection, TEM prep and large area cross-sectioning.
Gerry O’Loughlin, SEMTech Solutions, Inc.
Gerry O’Loughlin is a graduate of Boston College and is currently the President of SEMTech Solutions, Inc. For 10 years, SEMTech Solutions and Elionix have worked together to provide sales, service, and applications in both North America and Europe. Gerry manages the Elionix Electron Beam Lithography (EBL) product line in North America and Europe. Gerry has more than 25 years of electron beam instrumentation experience in various roles. Prior to SEMTech Solutions, Gerry held positions at AMRAY, KLA-Tencor, Veeco, and Physical Electronics.
Greg Fisher, Physical Electronics, Inc.
Dr. Gregory L. Fisher is a Principal Scientist at Physical Electronics specializing in TOF-SIMS applications and instrument development. Greg attended college at the University of Wisconsin – LaCrosse where he earned B.S. degrees in Chemistry and Physics. He went on to study under Prof. Nicholas Winograd at the Pennsylvania State University where he earned his Ph.D. in Chemistry. While at Penn State, Greg participated in the development of TOF-SIMS analytical instruments as well as research concerning the fundamental physics of ion-solid interactions. He was independently funded to pioneer the use of TOF-SIMS to probe the dynamics of metal atom reactions at functionalized surfaces, pushing the limits of detection at high mass resolution. Greg was at the Los Alamos National Laboratory (LANL) for two years as a Post-Doctoral Researcher and for five years as a Staff Scientist. He was primarily engaged in thin film growth and surface characterization for the development of reactive targets used in the high explosive reaction chemistry via ultrafast laser-excited spectroscopy (HERCULES) project. While at LANL, Greg was at the forefront of the use of cluster ion beams as analytical probes for TOF-SIMS analysis. He established the use of a C60 analytical ion beam in high sensitivity measurements to understand the effects of ionizing radiation on the chemical properties of polymers. Since joining Physical Electronics, Greg’s activities have included the application and optimization of cluster ion beams in TOF-SIMS analysis for 2D and 3D characterization of organic and inorganic materials, and the development of 3D imaging by FIB-TOF tomography. An underlying theme of Greg’s work has been the development of TOF-SIMS as a practical and reliable tool for biological and bio-materials analysis. A hallmark achievement has been the introduction of TOF-SIMS Parallel Imaging MS/MS. This tandem MS imaging capability enables unambiguous composition and structure elucidation of molecules without sacrificing speed or performance in TOF-SIMS or tandem MS imaging. Moreover, since the TOF-SIMS and the tandem MS imaging are achieved simultaneously, no TOF-SIMS imaging data is lost or discarded in the course of a tandem MS imaging analysis. Greg is one of four patent holders on this new and exciting technology.
Thomas F. Kelly, CAMECA
Thomas F. Kelly received his Bachelor of Science in Mechanical Engineering with highest honors from Northeastern University in June 1977. He then entered graduate school at the Massachusetts Institute of Technology and received a Ph.D. in Materials Science in December 1981. After one year as a postdoctoral associate at M.I.T., he joined the faculty of the Department of Metallurgical and Mineral Engineering of the University of Wisconsin-Madison in January 1983. He was a Full Professor from 1994 until his departure in 2001 from the renamed Department of Materials Science and Engineering. Tom was also Director of the Materials Science Center from 1992 to 1999.
While serving as a professor of Materials Science and Engineering in the University of Wisconsin-Madison College of Engineering until September 2001, Tom Kelly founded Imago Scientific Instruments to commercialize atom-probe microscopy-a technology that enables researchers to analyze materials at the atomic scale. His invention, the Local Electrode Atom Probe, or LEAP, captures a three-dimensional atom-by-atom “image” of a material and renders that image on a computer screen.
Tom Kelly has been active in the fields of analytical electron microscopy, atom probe microscopy, rapidly solidified materials, and electronic and superconducting materials for over 35 years. He has published over 240 papers and 16 patents in these fields in that time. Dr. Kelly is an authority on microstructural characterization. He is expert in most forms of transmission electron microscopy, scanning electron microscopy, and atom probe microscopy and has brought innovations to the instrumentation and practice.
Tom was a member of the executive council of the Microscopy Society of America from 2000 to 2002, the International Steering Committee of the International Field Emission Society from 2002 to 2008 and President of the International Field Emission Society from 2006 to 2008. He has served as the inaugural chair of the Microscopy Today Innovation Awards Committee for the Microscopy Society of America since 2010. Tom was an Editor of Microscopy and Microanalysis from 2010 to 2015 and is on the Editorial Board of Microscopy Today. From 2010 to 2012, Tom served on the Council of the Microanalysis Society. In 2012 he was elected President Elect of the Microanalysis Society and is serving as President from August 2014 to August 2016.
Tom has driven the innovation in instrumentation for atom probe tomography over the past two decades. He continues to pursue innovations such as pushing microscopy all the way to atomic-scale tomography by developing new detector technologies and combining atom probe tomography with electron microscopy in a single instrument.
Muriel Veron, NanoMEGAS
Muriel Veron received her Engineering degree and her Ph.D. in Material Science and Engineering from Grenoble-INP, France. After completing her Ph.D. in 1995, she joined the department of Materials Science and Engineering at McMaster University, Canada as a Postdoctoral Research Associate. In 1996 she moved back to France to take an Assistant Professor position at Grenoble-INP and SIMaP Laboratory (Material Science and Process Laboratory). She was made a Professor in 2008. Since 2009 she has held the post of Deputy Director of the engineering school Phelma, with 1200 students and important international collaborations. In July 2011, she was awarded APERAM Rene Castro Prize for her contributions in steel phase transformations and alloy design. In the Metal Physics department at SIMaP, her research focuses on the coupling between microstructure and mechanical properties. She works closely with industrial collaborators on fundamental and applied topics. Muriel Veron has contributed significantly to the development of TEM automated orientation mapping in association with the pioneering work of Dr. Edgar Rauch (CNRS). This has resulted in orientation and phase maps at the nanometer scale, and provided the scientific and industrial communities with a new and powerful tool to investigate materials.