2020 Facilities Days Open House Schedule

Introduction to Electron Backscattered Diffraction and Energy Dispersive X-ray Microanalysis 

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Tuesday, October 27th
12:00 – 1:30 p.m. Central Time

Presented by Chris Stephens, Thermo-Fisher Scientific

 

Project Highlights presented by:

  • Mohamed Elbakhshwan, Assistant Scientist in Engineering Physics
  • Dongzheng Chen, Graduate Student in Materials Science 

Introduction to Transmission Electron Microscopy 

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Thursday, October 29th
12:00 – 1:30 p.m. Central Time

Presented by Paul Voyles, Wisconsin MRSEC Director and Professor of Materials Science and Engineering, UW–Madison

What if we could know everything there was to know about the structure of a piece of material? Complete knowledge would constitute something like a list of all the 3D positions of all atoms, with the element of each atom specified, and measurement of all the electronic states at high resolution in real and momentum space. Modern electron microscopy cannot provide quite all of that information, but it can get surprisingly close. This talk will review the basics of TEM and STEM, including imaging, diffraction, and spectroscopy, then provide examples of cutting-edge applications that measure atomic structure, defects, and electronic states in a variety of materials and in various sample environments.

Project Highlight:

Microstructure and Microchemistry Study of Irradiation-Induced Precipitates in Proton Irradiated ZrNb Alloys 

Presented by Zefeng Yu, Graduate Student in Engineering Physics

Proton irradiation induced Nb redistribution in Zr-xNb alloys has been investigated using scanning transmission electron microscopy/energy dispersive X-ray spectroscopy (STEM/EDS). ZrxNb alloys are mainly composed of Zr matrix, native ZreNbeFe phases, and b-Nb precipitates. After 2 MeV proton irradiation at 350 C, a decrease of Nb content in native precipitates, as well as irradiation induced precipitation of Nb-rich platelets (135 ± 69 nm long and 27 ± 12 nm wide) were found. Nb-rich platelets and Zr matrix form the Burgers orientation relationship, [111]//[2110] and (011)//(0002). The platelets were found to be mostly coherent with the matrix with a few dislocations near the ends of the precipitate. The coherent strain field has been measured in the matrix and platelets by the 4D-STEM technique. The growth of Nb-rich platelets is mainly driven by coherency and dislocation-induced strain fields. Irradiation may both enhance the diffusion and induce segregation of interstitial Nb to the ends of the irradiation induced platelets, further facilitating their growth. 

Introduction to Raman Spectroscopy and Imaging

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Tuesday, November 3rd
12:00 – 1:30 p.m. Central Time

Presented by David Tuschel, Raman Applications Scientist, HORIBA Scientific 

This tutorial will teach introductory Raman spectroscopy and imaging. The chemical bond origins of Raman scattering along with the instrumentation used to acquire Raman spectra and images will be explained. In particular, we will discuss the selection of laser excitation wavelength, lateral and axial spatial resolution, detection limits, and laser polarization in micro-Raman sampling. We will also discuss the importance of spectral resolution and how to apply it when rendering a Raman image. Regarding applications, we will show examples of how Raman spectroscopy provides insight into the energetics of molecular interactions in the liquid and vapor phases, and that it can be used to distinguish crystalline polymorphs and differentiate single crystal, polycrystalline and amorphous materials in the solid state. The effects of chemical bonding, strain and crystallite size on Raman spectra will be addressed and we will show you how to image these characteristics. In addition, we will discuss how combined spectral imaging by laser excited photoluminescence and Raman scattering can be used to reveal the spatially varying solid-state structure of materials.

Introduction to X-ray Diffraction based techniques 

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Thursday, November 5th
12:00 – 1:30 p.m. Central Time

Presented by Don Savage, WCNT, UW–Madison

The tutorial will cover the basics of x-ray diffraction (XRD) and x-ray scattering. For XRD from polycrystalline materials, the focus will be on phase identification, texture, and grain size determination highlighting the use of the Bruker d8 discover x-ray diffractometer. Methods to determine thin-film stress, by measuring strain anisotropy will also be discussed. For single crystals, high-resolution XRD to determine epitaxial film thickness and strain using the Panalytical Empyrean x-ray diffractometer will be discussed. For x-ray scattering in reflection (XRR), film density, thickness, and interface roughness can be determined even for amorphous or polycrystalline layers. When used in transmission, the technique is called small-angle x-ray scattering (SAX), where the size and ordering of domains in the 10’s of nanometer scale can be analyzed. As the talk proceeds, the focus will be on the best technique needed to approach a specific material’s characterization problem as well as its strengths and limitations.

Project Highlights:

  • Surface X-ray Scattering and Reflectivity Studies for Complex Oxide Solid Phase Epitaxy
    Presented by Samuel Marks, Graduate Student, Materials Science & Engineering
  • X-ray Diffraction Study of Magnetic Half-Heusler Thin Films and Membranes
    Presented by Dongxue Du, Graduate Student, Materials Science & Engineering

Introduction to XPS

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Tuesday, November 10th
12:00 – 1:30 p.m. Central Time

Presented by Jerry Hunter, WCNT Director, UW–Madison

MRSEC Current Status of X-ray Endstation Development

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Thursday, November 12th
12:00 – 1:30 p.m. Central Time

Presented by TBD

Introduction to Secondary Ion Mass Spectrometry

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Tuesday, November 17th
12:00 – 1:30 p.m. Central Time

Presented by Jerry Hunter, WCNT Director, UW–Madison

Overview of the Dynacool Physical Property Measurement System

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Thursday, November 19th
12:00 – 1:30 p.m. Central Time

Presented by Rick Hapanowicz, Quantum Design