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Overview
Jerry Hunter, UW–Madison WCNT
Microscopy Techniques
Room 1106
Scanning Electron Microscopy & EDS
John Kelley, Zeiss
User Applications
Mia Lenling, UW–Madison
Claire Griesbach, UW–Madison
Transmission Electron Microscopy
Paul Voyles, UW–Madison MSE
Cryoelectron Microscopy
Elizabeth Wright, UW–Madison Biochemistry
User Applications
Xuying Liu , UW–Madison
Joseph Kim, UW–Madison
Focused Ion Beam
Jerry Hunter, UW–Madison WCNT
User Applications
Ben Knipfer, UW–Madison
X-ray Analysis Methods (XRD, XRR, etc.)
User Applications
Nayomi Plaza-Rodriquez, Forest Products Laboratory
Scanned Probe Microscopy
John Thornton, Bruker
User Applications
Sean Foradori, UW–Madison
Chengrong Cao, UW–Madison
Microanalysis
Room 1153
Optical Spectroscopy
Nolan Wong, Horiba Instruments
User Applications
Haridas Kar, UW–Madison
Surface Analysis (XPS and Auger)
John Jacobs, UW–Madison WCNT
User Applications
Mohamed Elbakhshwan, UW–Madison
Nanoindentation
Julie Morasch, UW–Madison WCNT
User Applications
Vrishank Jambur, UW–Madison
Rheometry and Dynamic Mechanical Analysis
Greg Kamykowski, TA Instruments
User Applications
Tori Harms, UW–Madison
Jun Li, UW–Madison
Basics of Nanoscale Fabrication
Dan Christensen, UW–Madison WCNT
User Applications
Matthew Dwyer, UW–Madison
Nathan Holman, UW–Madison
Felix Jaeckel, UW–Madison
Wrap Up
Jerry Hunter, UW–Madison WCNT